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2022

SafeSU-2: a Safe Statistics Unit for Space MPSoCs

2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)

G. Cabo, S. Alcaide, C. Hernandez, P. Benedicte, F. Bas, F. Mazzocchetti, and J. Abella

2021

SafeSU: an Extended Statistics Unit for Multicore Timing Interference

2021 IEEE European Test Symposium (ETS)2021 IEEE European Test Symposium (ETS)

G. Cabo, F. Bas, R. Lorenzo, D. Trilla, S. Alcaide, M. Moretó, C. Hernandez, and J. Abella
Security, Reliability and Test Aspects of the RISC-V Ecosystem

2021 IEEE European Test Symposium (ETS)2021 IEEE European Test Symposium (ETS)

J. Abella, S. Alcaide, J. Anders, F. Bas, S. Becker, E. De Mulder, N. Elhamawy, F. K. Gurkaynak, H. Handschuh, C. Hernandez, M. Hutter, L. Kosmidis, I. Polian, M. Sauer, S. Wagner, and F. Regazzoni

2019

Worst-Case Energy Consumption: A New Challenge for Battery-Powered Critical Devices

IEEE Transactions on Sustainable Computing

D. Trilla, C. Hernandez, J. Abella, and F. J. Cazorla
An Approach for Detecting Power Peaks During Testing and Breaking Systematic Pathological Behavior

2019 22nd Euromicro Conference on Digital System Design (DSD)

D. Trilla, C. Hernandez, J. Abella, and F. J. Cazorla
Modeling the Impact of Process Variations in Worst-Case Energy Consumption Estimation

2019 22nd Euromicro Conference on Digital System Design (DSD)

D. Trilla, C. Hernandez, J. Abella, and F. J. Cazorla
Randomization for Safer, more Reliable and Secure, High-Performance Automotive Processors

IEEE Design & Test

D. Trilla, C. Hernandez, J. Abella, and F. J. Cazorla
Randomization for Safer, more Reliable and Secure, High-Performance Automotive Processors

IEEE Design & Test

D. Trilla, C. Hernandez, J. Abella, and F. J. Cazorla
High-Integrity GPU Designs for Critical Real-Time Automotive Systems

2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)

S. Alcaide, L. Kosmidis, C. Hernandez, and J. Abella
LAEC: Look-Ahead Error Correction Codes in Embedded Processors L1 Data Cache

2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)

P. Benedicte, C. Hernandez, J. Abella, and F. J. Cazorla

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