URL: https://ieeexplore.ieee.org/document/9774540/
Authors: Bas, Francisco / Benedicte, Pedro / Alcaide, Sergi / Cabo, Guillem / Mazzocchetti, Fabio / Abella, Jaume
Publication: 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Place Published: Antwerp, Belgium
Pagination: 358 - 363
Keywords: SELENE, common cause failures, diversity, MPSoC, RISC-V