Fault Characterization Through FPGA Undervolting

International Conferences 2018

URL: https://ieeexplore.ieee.org/document/8533473/

Authors: Salami, Behzad / Ünsal, Osman / Cristal, Adrian

Publication: 2018 28th International Conference on Field Programmable Logic and Applications (FPL)

Pagination: 85 - 853