URL: http://ieeexplore.ieee.org/document/7820072/
UPCommons Handle URL http://upcommons.upc.edu/handle/2117/103465
Authors: Trilla, David / Hernandez, Carles / Abella, Jaume / Cazorla, Francisco
Publication: IEEE Transactions on Device and Materials Reliability
Volume / Number / Pagination: 17 / 1 / 32 - 41