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2016

TASA: Toolchain-Agnostic Static Software Randomisation for Critical Real-Time Systems

35th International Conference On Computer Aided Design (ICCAD)

L. Kosmidis, R. Vargas, D. Morales, E. Quinones, J. Abella, and F. Cazorla
Measurement-Based Timing Analysis of the AURIX Caches

16th International Workshop on Worst-Case Execution Time Analysis (WCET)

L. Kosmidis, D. Compagnin, D. Morales, E. Mezzetti, E. Quinones, J. Abella, T. Vardanega, and F. Cazorla
Modeling RTL Fault Models Behavior to Increase the Confidence on TSIM-based Fault Injection

22nd IEEE International On-Line Testing Symposium (IOLTS)

J. Espinosa, C. Hernández, and J. Abella
Random Modulo: a New Processor Cache Design for Real-Time Critical Systems

53rd Design Automation Conference (DAC)

C. Hernández, J. Abella, A. Gianarro, J. Andersson, and F. Cazorla
A Confidence Assessment of WCET Estimates for Software Time Randomized Caches

2016 IEEE 14th International Conference on Industrial Informatics (INDIN)

P. Benedicte, L. Kosmidis, E. Quinones, J. Abella, and F. Cazorla
Modelling the Confidence of Timing Analysis for Time Randomised Caches

2016 11th IEEE International Symposium on Industrial Embedded Systems (SIES)

P. Benedicte, L. Kosmidis, E. Quinones, J. Abella, and F. Cazorla
Resilient Random Modulo Cache Memories for Probabilistically-Analyzable Real-Time Systems

22nd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS)

D. Trilla, C. Hernández, J. Abella, and F. Cazorla
Modelling Probabilistic Cache Representativeness in the Presence of Arbitrary Access Patterns

ISORC 2016 19th IEEE Symposium On Real-Time Computing

S. Milutinovic, J. Abella, and F. Cazorla
Mitigating Software-Instrumentation Cache Effects in Measurement-Based Timing Analysis

16th International Workshop on Worst-Case Execution Time Analysis (WCET)

E. Díaz, J. Abella, E. Mezzetti, I. Agirre, M. Azkarate-askasua, T. Vardanega, and F. Cazorla
Contention-Aware Performance Monitoring Counter Support for Real-Time MPSoCs

11th IEEE International Symposium on Industrial Embedded Systems (SIES)

J. Jalle, M. Fernández, J. Abella, J. Andersson, M. Patte, L. Fossati, M. Zulianello, and F. Cazorla

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