URL: http://ieeexplore.ieee.org/document/8342174/
Authors: Bielski, M. / Syrigos, I. / Katrinis, K. / Syrivelis, D. / Reale, A. / Theodoropoulos, D. / Alachiotis, N. / Pnevmatikatos, D. / Pap, E.H. / Zervas, / Mishra, V. / Saljoghei, A. / Rigo, A. / Zazo, Fernando / Lopez-Buedo, S. / Torrents, M. / Zyulkyarov, / Enrico, M. / de Dios, Gonzalez
Publication: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Pagination: 1093 - 1098