URL: https://ieeexplore.ieee.org/document/9465449/
Authors: Abella, Jaume / Alcaide, Sergi / Anders, Jens / Bas, Francisco / Becker, Steffen / De Mulder, Elke / Elhamawy, Nourhan / Gurkaynak, Frank / Handschuh, Helena / Hernandez, Carles / Hutter, Mike / Kosmidis, Leonidas / Polian, Ilia / Sauer, Matthias / Wagner, Stefan / Regazzoni, Francesco
Publication: 2021 IEEE European Test Symposium (ETS)2021 IEEE European Test Symposium (ETS)
Place Published: Bruges, Belgium
Volume / Pagination: 16662019202010146 / 1 - 10
Paraules clau: SELENE, Reliability, RISC-V, Security, Side Channel Attacks, Testing