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2016

A Detailed Methodology to Compute Soft Error Rates in Advanced Technologies

In Proceedings of the Design Automation and Test in Europe (DATE) Dresden, Germany

M. Riera, R. Canal, J. Abella, and A. González

2015

Timely Error Detection for Effective Recovery in Light-Lockstep Automotive Systems

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (IEEE TCAD)

C. Hernández, and J. Abella
Experiences and Results of Parallelisation of Industrial Hard Real-time Applications for the parMERASA Multi-core

3rd Workshop on High-performance and Real-time Embedded Systems (HiRES), Amsterdam, The Netherlands

T. Ungerer, C. Bradatsch, M. Frieb, F. Kluge, J. Mische, A. Stegmeier, R. Jahr, M. Gerdes, P. Zaykov, L. Matusova, Z. Jian Jia Li, Z. Petrov, B. Boddeker, S. Kehr, H. Regler, A. Hugl, C. Roc, H. Ozaktas, H. Casse, A. Bonenfant, P. Sainrat, N. Lay, D. George, I. Broster, E. Quinones, M. Panic, J. Abella, C. Hernández, F. Cazorla, S. Uhrig, M. Rohde, and A. Pyka
Low-cost Checkpointing in Automotive Safety-Relevant Systems

2015 Design, Automation & Test in Europe Conference & Exhibition (DATE)

C. Hernández, and J. Abella
Analysis and RTL Correlation of Instruction Set Simulators for Automotive Microcontroller Robustness Verification

Design Automation Conference (DAC), 2015 52nd ACM/EDAC/IEEE

J. Espinosa, C. Hernández, J. Abella, D. De Andres, and J. Carlos Ruiz
Characterizing Fault Propagation in Safety-Critical Processor Designs

21st IEEE International On-Line Testing Symposium (IOLTS), Elia, Halkidiki, Greece

J. Espinosa, C. Hernández, and J. Abella
Towards Certification-aware Fault Injection Methodologies Using Virtual Prototypes

10th IEEE Forum on specification & Design Languages (FDL), Barcelona, Spain

J. Espinosa, D. De Andres, J. Carlos Ruiz, C. Hernández, and J. Abella
Randomized Caches Can Be Pretty Useful to Hard Real-Time Systems

LITES

E. Mezzetti, M. Ziccardi, T. Vardanega, J. Abella, E. Quinones, and F. Cazorla
PACO: Fast Average-Performance Estimation for Time-Randomized Caches

2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC)

S. Milutinovic, E. Quinones, J. Abella, and F. Cazorla
WCET Analysis Methods: Pitfalls and Challenges on their Trustworthiness

10th IEEE International Symposium on Industrial Embedded Systems (SIES)

J. Abella, C. Hernández, E. Quinones, F. Cazorla, P. Ryan Conmy, M. Azkarate-askasua, J. Perez, E. Mezzetti, and T. Vardanega

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