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2017

Aging Assessment and Design Enhancement of Randomized Cache Memories

IEEE Transactions on Device and Materials Reliability

D. Trilla, C. Hernandez, J. Abella, and F. Cazorla
Measurement-Based Worst-Case Execution Time Estimation Using the Coefficient of Variation

ACM Transactions on Design Automation of Electronic Systems

J. Abella, M. Padilla, J. Del Castillo, and F. Cazorla
Adapting TDMA arbitration for measurement-based probabilistic timing analysis

Microprocessors and Microsystems

M. Panic, J. Abella, E. Quinones, C. Hernandez, T. Ungerer, and F. Cazorla
DIMP: A Low-Cost Diversity Metric Based on Circuit Path Analysis

DAC '17 Proceedings of the 54th Annual Design Automation Conference 2017

S. Alcaide, C. Hernandez, A. Roca, and J. Abella
EPC Enacted: Integration in an Industrial Toolbox and Use against a Railway Application

2017 IEEE Real-Time and Embedded Technology and Applications Symposium (RTAS)

E. Mezzetti, M. Fernandez, A. Bardizbanyan, I. Agirre, J. Abella, T. Vardanega, and F. Cazorla
On uses of Extreme Value Theory fit for industrial-quality WCET analysis

SIES 2017 12th IEEE International Symposium on Industrial Embedded Systems, Work in Progress session

S. Milutinovic, E. Mezzetti, J. Abella, T. Vardanega, and F. Cazorla
Software Time Reliability in the Presence of Cache Memories

Ada Europe 2017 22nd International Conference on Reliable Software Technologies

S. Milutinovic, J. Abella, I. Agirre, M. Azkarate-askasua, E. Mezzetti, T. Vardanega, and F. Cazorla
On the Assessment of Probabilistic WCET Estimates Reliability for Arbitrary Programs

EURASIP Journal on Embedded Systems

S. Milutinovic, J. Abella, and F. Cazorla
MC2: Multicore and Cache Analysis via Deterministic and Probabilistic Jitter Bounding

Ada Europe 2017 22nd International Conference on Reliable Software Technologies

E. Díaz, M. Fernández, L. Kosmidis, E. Mezzetti, C. Hernández, J. Abella, and F. Cazorla
Design and implementation of a fair credit-based bandwidth sharing scheme for buses

2017 Design, Automation & Test in Europe Conference & Exhibition (DATE)

M. Slijepcevic, C. Hernandez, J. Abella, and F. Cazorla

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