Analysis and RTL Correlation of Instruction Set Simulators for Automotive Microcontroller Robustness Verification

International Conferences 2015

URL:  http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=7167224&openedRefinements%3D*%26filter%3DAND%28NOT%284283010803%29%29%26pageNumber%3D8%26rowsPerPage%3D100%26queryText%3DDesign+Automation+Conference

Authors: Espinosa, Jaime / Hernández, Carles / Abella, Jaume / De Andres, David / Ruiz, Juan

Publication: Design Automation Conference (DAC), 2015 52nd ACM/EDAC/IEEE